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Reliability, Robustness And Failure Mechanisms Of Led Devices: Methodology And Evaluation

Yannick Deshayes , Laurent Bechou , Laurent Béchou
Sep 26, 2016
$162.95
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Overview

Appropriate for
Language
English
No. of Pages
172
Publisher: Elsevier
Shipping dimensions: 9" H x 6" W x 1" L
ISBN: 9781785481529
Life stage: null

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