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Advances in X-Ray Analysis: Volume 32

Edited by Charles S Barrett , J V Gilfrich , Ron Jenkins
Jun 18, 2013
$285.95
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Overview

Appropriate for
Language
No. of Pages
682
Publisher: Springer US
Shipping dimensions: 10" H x 7" W x 1" L
ISBN: 9781475791129
Life stage: null

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