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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis

Alvin W. Czanderna Edited by Theodore E. Madey , Cedric J. Powell
Dec 06, 2010
$248.50
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Overview

Appropriate for
Language
English
No. of Pages
430
Methods Of Surface Characterization
Publisher: Springer/Sci-Tech/Trade
Shipping dimensions: 9" H x 6" W x 1" L
ISBN: 9781441932990
Life stage: null

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