Buy Now, In-Store Pick Up Only

  • Front cover_Power-Constrained Testing of VLSI Circuits
Free Preview of Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard

Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard

Nicola Nicolici , Bashir M. Al-Hashimi
Dec 09, 2010
$160.95
Online pricing. Prices and offers may vary in store.
.
.
This product requires a minimum order of  1
Final Sale. No returns or exchanges.
This item will be shipped by appointment through our delivery partner.

Ship to me

Checking availability…

Buy now & pick up in store

Checking availability…

Find it in store

Checking availability…

Earn 805 points and enjoy extra savings with plum+. 

Overview

Appropriate for
Language
English
No. of Pages
178
Frontiers in Electronic Testing
Publisher: Springer/Sci-Tech/Trade
Shipping dimensions: 9" H x 6" W x 1" L
ISBN: 9781441953155
Life stage: null

You May Also Like

Ratings & Reviews

  • bvseo_sdk, dw_cartridge, 18.2.0, p_sdk_3.2.0
  • CLOUD, getReviews, 5ms
  • reviews, product
  • bvseo-msg: Unsuccessful GET. status = 'ERROR', msg = 'Not Found.'; Unsuccessful GET. status = 'ERROR', msg = 'Not Found.';

Editorial reviews

Author

Others Also Bought

Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard 946E63F0-BF7A-4A75-8C14-E298E3876E60
Power-constrained Testing Of Vlsi Circuits: A Guide to the IEEE 1149.4 Test Standard
https://dynamic.indigoimages.ca/v1/books/books/140207235X/1.jpg
160.95
Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard
https://dynamic.indigoimages.ca/v1/books/books/1441953159/1.jpg
160.95