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Digital Noise Monitoring of Defect Origin

Telman Aliev
Nov 24, 2010
$160.95
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Overview

Appropriate for
Language
English
No. of Pages
224
Lecture Notes in Electrical Engineering
Publisher: Springer/Sci-Tech/Trade
Shipping dimensions: 9" H x 6" W x 1" L
ISBN: 9781441944108
Life stage: null

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