Buy Now, In-Store Pick Up Only

  • Front cover_Lifetime Spectroscopy
Free Preview of Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications

Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications

Stefan Rein
Oct 19, 2010
$481.95
Online pricing. Prices and offers may vary in store.
.
.
This product requires a minimum order of  1
Final Sale. No returns or exchanges.
This item will be shipped by appointment through our delivery partner.

Ship to me

Checking availability…

Buy now & pick up in store

Checking availability…

Find it in store

Checking availability…

Earn 2,410 points and enjoy extra savings with plum+. 

Overview

Appropriate for
Language
English
No. of Pages
492
Springer Series in Materials Science
Publisher: Springer/Sci-Tech/Trade
Shipping dimensions: 9" H x 6" W x 1" L
ISBN: 9783642064531
Life stage: null

You May Also Like

Ratings & Reviews

  • bvseo_sdk, dw_cartridge, 18.2.0, p_sdk_3.2.0
  • CLOUD, getReviews, 4ms
  • reviews, product
  • bvseo-msg: Unsuccessful GET. status = 'ERROR', msg = 'Not Found.'; Unsuccessful GET. status = 'ERROR', msg = 'Not Found.';

Editorial reviews

Author

Others Also Bought

Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications 13C1C22C-E985-48E6-98D6-FF5E0D960169
Lifetime Spectroscopy: A Method Of Defect Characterization In Silicon For Photovoltaic Applications
https://dynamic.indigoimages.ca/v1/books/books/3540253033/1.jpg
481.95
Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications
https://dynamic.indigoimages.ca/v1/books/books/3642064531/1.jpg
481.95