Buy Now, In-Store Pick Up Only

  • Front cover_Scanning Probe Microscopy in Industrial Applications
Free Preview of Scanning Probe Microscopy in Industrial Applications: Nanomechanical Characterization

Scanning Probe Microscopy in Industrial Applications: Nanomechanical Characterization

Edited by Dalia G. Yablon
Dec 04, 2013
$182.95
Online pricing. Prices and offers may vary in store.
.
.    Learn More
This product requires a minimum order of  1
Final Sale. No returns or exchanges.
This item will be shipped by appointment through our delivery partner.

Ship to me

Checking availability…

Buy now & pick up in store

Checking availability…

Find it in store

Checking availability…

Earn 915 points and enjoy extra savings with plum+. 

Overview

Appropriate for
Language
English
No. of Pages
368
Publisher: Wiley
Shipping dimensions: 10" H x 6" W x 1" L
ISBN: 9781118288238
Life stage: null

You May Also Like

Ratings & Reviews

  • bvseo_sdk, dw_cartridge, 18.2.0, p_sdk_3.2.0
  • CLOUD, getReviews, 5ms
  • reviews, product
  • bvseo-msg: Unsuccessful GET. status = 'ERROR', msg = 'Not Found.'; Unsuccessful GET. status = 'ERROR', msg = 'Not Found.';

Editorial reviews

dalia g yablon

Author

Others Also Bought

Scanning Probe Microscopy in Industrial Applications: Nanomechanical Characterization 8C8465E7-2801-4D60-B50D-B49051C69796
Scanning Probe Microscopy in Industrial Applications: Nanomechanical Characterization
https://dynamic.indigoimages.ca/v1/books/books/1118288238/1.jpg
182.95
Scanning Probe Microscopy in Industrial Applications: Nanomechanical Characterization
https://dynamic.indigoimages.ca/v1/https://cdn.kobo.com/book-images/c026cd45-3daa-46bc-a148-b43127664819/300/300/False/image.jpg
146.99