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Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

Ruijing Shen , Sheldon X.-d. Tan , Hao Yu
Apr 13, 2014
$168.95
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Overview

Appropriate for
Language
English
No. of Pages
306
Publisher: Springer New York
Shipping dimensions: 9" H x 6" W x 1" L
ISBN: 9781489987877
Life stage: null

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