Buy Now, In-Store Pick Up Only

  • Front cover_Testing Static Random Access Memories
Free Preview of Testing Static Random Access Memories: Defects, Fault Models and Test Patterns

Testing Static Random Access Memories: Defects, Fault Models and Test Patterns

Said Hamdioui
Dec 09, 2010
$160.95
Online pricing. Prices and offers may vary in store.
.
This product requires a minimum order of  1
Final Sale. No returns or exchanges.
This item will be shipped by appointment through our delivery partner.

Ship to me

Checking availability…

Buy now & pick up in store

Checking availability…

Find it in store

Checking availability…

Earn 805 points and enjoy extra savings with plum+. 

Overview

Appropriate for
Language
English
No. of Pages
221
Frontiers in Electronic Testing
Publisher: Springer/Sci-Tech/Trade
Shipping dimensions: 9" H x 6" W x 1" L
ISBN: 9781441954305
Life stage: null

You May Also Like

Ratings & Reviews

  • bvseo_sdk, dw_cartridge, 18.2.0, p_sdk_3.2.0
  • CLOUD, getReviews, 5ms
  • reviews, product
  • bvseo-msg: Unsuccessful GET. status = 'ERROR', msg = 'Not Found.'; Unsuccessful GET. status = 'ERROR', msg = 'Not Found.';

Editorial reviews

Author

Others Also Bought

Testing Static Random Access Memories: Defects, Fault Models and Test Patterns BD1B8F61-0117-47B5-AF2C-AB09617B14D9
Testing Static Random Access Memories: Defects, Fault Models and Test Patterns
https://dynamic.indigoimages.ca/v1/books/books/1402077521/1.jpg
160.95
Testing Static Random Access Memories: Defects, Fault Models and Test Patterns
https://dynamic.indigoimages.ca/v1/books/books/1441954309/1.jpg
160.95