Criticism After Critique: Aesthetics, Literature, And The Political

Jeffrey R. Di Leo
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Criticism After Critique: Aesthetics, Literature, And The Political

Jeffrey R. Di Leo
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Found in: Philosophy, Philosophy

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Overview

229 PAGESENGLISH

Promotional Details
  • Published date: Dec 18, 2015
  • Language: English
  • No. of Pages: 229
  • Publisher: Palgrave Macmillan
  • ISBN: 9781349491575
  • Dimensions: 5.51" W x 1.0" L x 8.5" H
Charles Altieri, University of California, Berkeley, USA R. M. Berry, Florida State University, USA Robert Chodat, Boston University, USA Allen Dunn, University of Tennessee, USA Sue-Im Lee, Temple University, USA Hassan Melehy, University of North Carolina, Chapel Hill, USA Christian Moraru, University of North Carolina, Greensboro, USA Brian O'Keeffe, Barnard College, USA David R. Shumway, Carnegie Mellon University, USA Nicole Simek, Whitman College, USA Alan Singer, Temple University, USA Zahi Zalloua, Whitman College, USA

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