Electron Nano-imaging: Basics Of Imaging And Diffraction For Tem And Stem

Nobuo Tanaka
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Electron Nano-imaging: Basics Of Imaging And Diffraction For Tem And Stem

Nobuo Tanaka
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Found in: Science & Nature, General Science

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Overview

333 PAGESENGLISH

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  • Published date: Aug 13, 2024
  • Language: English
  • No. of Pages: 333
  • Publisher: Springer/Sci-Tech/Trade
  • ISBN: 9784431565000
  • Dimensions: 6.1" W x 1.0" L x 9.25" H
Dr. Nobuo Tanaka is a designated professor of Institute of Materials and Systems for Sustainability (IMaSS) of Nagoya University and an adjunct senior researcher of Japan Fine Ceramic Center (JFCC). He received a ph.D degree from Applied Physics Department of Nagoya University in 1978, and became an assistant professor of the department. He stayed Arizona State University as a visiting scholar to study with the late Prof. J. Cowley from 1983 to 1985. He was appointed a full professor of Applied Physics of Nagoya University in 1999 through an associate professor. In 2001, he moved to Center of Integrated Research for Science and Engineering (CIRSE) of Nagoya University, which was renamed EcoTopia Science Institute (ESI) in 2004. He was the director of the institute from 2012 to 2015. He is also the president of Japanese Microscopy Society (JSM) from 2015 to 2017. His professionals are high-resolution electron microscopy and nano-diffraction, and physics of atomic clusters and thin filmsas well as surfaces and interfaces of semiconductors. He is also the editor/author of a textbook asScanning Transmission Electron Microscopy of Nanomaterials.

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