Structural, Syntactic, and Statistical Pattern Recognition: Joint Iapr International Workshop, Sspr

Edwin R. Hancock
Edited by Richard C Wilson , Terry Windeatt
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Structural, Syntactic, and Statistical Pattern Recognition: Joint Iapr International Workshop, Sspr

Edwin R. Hancock
Edited by Richard C Wilson , Terry Windeatt
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Found in: Reference, COMPUTERS GENERAL

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Overview

758 PAGESENGLISH

Promotional Details
  • Published date: Jul 30, 2010
  • Language: English
  • No. of Pages: 758
  • Publisher: Springer/Sci-Tech/Trade
  • ISBN: 9783642149795
  • Dimensions: 1.0" W x 1.0" L x 1.0" H

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