The Stanford Revision and Extension of the Binet-Simon Scale for Measuring Intelligence (Classic Reprint)

Lewis M. Terman
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The Stanford Revision and Extension of the Binet-Simon Scale for Measuring Intelligence (Classic Reprint)

Lewis M. Terman
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Overview

190 PAGESENGLISH

Promotional Details
  • Published date: Feb 19, 2019
  • Language: English
  • No. of Pages: 190
  • Publisher: 1KG Limited
  • ISBN: 9781332795994
  • Dimensions: 6.0" W x 0.4" L x 9.0" H

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