3D Scanning for Advanced Manufacturing, Design, and Construction: Metrology for Advanced Manufacturing

Gary C. Confalone , Gary Confalone , John Smits
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3D Scanning for Advanced Manufacturing, Design, and Construction: Metrology for Advanced Manufacturing

Gary C. Confalone , Gary Confalone , John Smits
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Trouvé dans : Science & Nature, General Science

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224 PAGESANGLAIS

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  • Date de publication : Mar 21, 2023
  • Langue : anglais
  • Nombre de pages : 224
  • Éditeur : Wiley
  • ISBN : 9781119758518
  • Dimensions : 1.0" W x 1.0" L x 1.0" H

Gary C. Confalone, BSEE, MSME, is the CEO of ECM Global, a company specializing in 3D scanning and reverse engineering. He has spent the past three decades working in the metrology industry with the first half of his career focused on the development of laser-based measurement systems, and processes, for the aerospace industry. He has served as Chair for both the Coordinate Metrology Society and the 3D Certification Committee, and was recently awarded the American Society for Quality (ASQ) Hromi Medal. Gary received a Bachelor's degree from the University of Massachusetts, and a Master’s Degree from Boston University.

John Smits, AIA, is VP of ECM, AEC Division, a registered architect, and one of the initial adopters of large volume 3D laser scanning technology as applied specifically to the architecture, engineering, and construction professions. He has shared his expertise as a speaker at trade shows, conferences, and online webinars, and authored articles in academic journals and trade magazines. John earned a Bachelor’s degree in Architecture from the University of Virginia and a Master’s degree in Architecture from Washington University in St. Louis.

Thomas Kinnare, BSME, is Principal Engineer and lead developer of the ECM Training Division. Over the past two decades, Tom has been instrumental in the advancement of 3D metrology practices throughout the industry, working to institute an international metrology education and certification training program. He currently serves on the American Society of Mechanical Engineers (ASME) Y14.45, GD&T Reporting Subcommittee, and the Coordinate Measurement Society Certification Committee. Tom earned his Bachelor’s degree from Massachusetts Institute of Technology.

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